WEKO3
アイテム
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling
http://hdl.handle.net/10228/5678
http://hdl.handle.net/10228/5678001d1e50-55d0-49ed-a5ff-8b7e82b11a6a
| 名前 / ファイル | ライセンス | アクション |
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110828ats2011.pdf (118.2 kB)
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||||||||
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| 公開日 | 2016-05-19 | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| タイトル | ||||||||||||
| タイトル | Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling | |||||||||||
| 言語 | en | |||||||||||
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| 言語 | eng | |||||||||||
| 著者 |
宮瀬, 紘平
× 宮瀬, 紘平
WEKO
6567
× Uchinodan, Y.× Enokimoto, K.× Yamato, Y.× 温, 暁青× 梶原, 誠司× Wu, F.× Dilillo, L.× Bosio, A.× Girard, P.× Virazel, A. |
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| 抄録 | ||||||||||||
| 内容記述タイプ | Abstract | |||||||||||
| 内容記述 | It has become necessary to reduce power during LSI testing. Particularly, during at-speed testing, excessive power consumed during the Launch-To-Capture (LTC) cycle causes serious issues that may lead to the overkill of defect-free logic ICs. Many successful test generation approaches to reduce IR-drop and/or power supply noise during LTC for the launch-off capture (LOC) scheme have previously been proposed, and several of X-filling techniques have proven especially effective. With X-filling in the launch-off shift (LOS) scheme, however, adjacent-fill (which was originally proposed for shift-in power reduction) is used frequently. In this work, we propose a novel X-filling technique for the LOS scheme, called Adjacent-Probability-based X-Filling (AP-fill), which can reduce more LTC power than adjacent-fill. We incorporate AP-fill into a post-ATPG test modification flow consisting of test relaxation and X-filling in order to avoid the fault coverage loss and the test vector count inflation. Experimental results for larger ITC'99 circuits show that the proposed AP-fill technique can achieve a higher power reduction ratio than 0-fill, 1-fill, and adjacent-fill. | |||||||||||
| 言語 | en | |||||||||||
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| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 2011 Asian Test Symposium, 20-23 November 2011, New Delhi, India | |||||||||||
| 書誌情報 |
en : 20th Asian test symposium : (ATS 2011) : New Delhi, India : 20-23 November 2011 巻 2011, p. 90-95, 発行日 2011-11-20 |
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| 出版社 | ||||||||||||
| 出版社 | IEEE | |||||||||||
| DOI | ||||||||||||
| 関連タイプ | isVersionOf | |||||||||||
| 識別子タイプ | DOI | |||||||||||
| 関連識別子 | https://doi.org/10.1109/ATS.2011.35 | |||||||||||
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| 識別子タイプ | ISBN | |||||||||||
| 関連識別子 | 978-1-4577-1984-4 | |||||||||||
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| 収録物識別子タイプ | EISSN | |||||||||||
| 収録物識別子 | 2377-5386 | |||||||||||
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| 収録物識別子タイプ | PISSN | |||||||||||
| 収録物識別子 | 1081-7735 | |||||||||||
| 著作権関連情報 | ||||||||||||
| 権利情報 | Copyright (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
| 出版タイプ | ||||||||||||
| 出版タイプ | AM | |||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
| 査読の有無 | ||||||||||||
| 値 | yes | |||||||||||
| 研究者情報 | ||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||||||||
| 連携ID | ||||||||||||
| 値 | 5410 | |||||||||||
