WEKO3
アイテム
Low Power BIST for Scan-Shift and Capture Power
http://hdl.handle.net/10228/00006257
http://hdl.handle.net/10228/000062573ecf3c3b-016d-4f9a-8139-bec162baf24e
| 名前 / ファイル | ライセンス | アクション |
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ats_173_178.pdf (550.3 kB)
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||||||||
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| 公開日 | 2017-07-11 | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| タイトル | ||||||||||||
| タイトル | Low Power BIST for Scan-Shift and Capture Power | |||||||||||
| 言語 | en | |||||||||||
| 言語 | ||||||||||||
| 言語 | eng | |||||||||||
| 著者 |
Sato, Yasuo
× Sato, Yasuo× Wang, Senling× Kato, Takaaki× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司 |
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| 抄録 | ||||||||||||
| 内容記述タイプ | Abstract | |||||||||||
| 内容記述 | Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophisticated methods are proposed for scan-test, there are not so many for logic BIST because of its uncontrollable randomness. However, logic BIST currently becomes vital for system debug or field test. This paper proposes a novel low power BIST technology that reduces shift-power by eliminating the specified high-frequency parts of vectors and also reduces capture power. The authors show that the proposed technology not only reduces test power but also keeps test coverage with little loss. | |||||||||||
| 言語 | en | |||||||||||
| 備考 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 2012 IEEE 21st Asian Test Symposium, 19-22 Nov. 2012, Niigata, Japan | |||||||||||
| 書誌情報 |
en : 2012 IEEE 21st Asian Test Symposium p. 173-178, 発行日 2012-12-31 |
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| 出版社 | ||||||||||||
| 出版社 | IEEE | |||||||||||
| DOI | ||||||||||||
| 関連タイプ | isVersionOf | |||||||||||
| 識別子タイプ | DOI | |||||||||||
| 関連識別子 | https://doi.org/10.1109/ATS.2012.27 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||
| 収録物識別子 | 2377-5386 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||
| 収録物識別子 | 1081-7735 | |||||||||||
| 著作権関連情報 | ||||||||||||
| 権利情報 | Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | capture power | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | low power | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | BIST | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | shift-power | |||||||||||
| 出版タイプ | ||||||||||||
| 出版タイプ | AM | |||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
| 査読の有無 | ||||||||||||
| 値 | yes | |||||||||||
| 研究者情報 | ||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||||||||
| 論文ID（連携） | ||||||||||||
| 値 | 10296247 | |||||||||||
| 連携ID | ||||||||||||
| 値 | 6195 | |||||||||||
