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16-channnel Micro Magnetic Flux Sensor Array for IGBT Current Distribution Measurement
http://hdl.handle.net/10228/00006293
http://hdl.handle.net/10228/00006293691ae3f6-a0dd-47d3-9ac9-2cdd5ed8f5a7
名前 / ファイル | ライセンス | アクション |
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nperc65.pdf (874.1 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||
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公開日 | 2017-08-21 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
資源タイプ | journal article | |||||||||||
タイトル | ||||||||||||
タイトル | 16-channnel Micro Magnetic Flux Sensor Array for IGBT Current Distribution Measurement | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
Tomonaga, H.
× Tomonaga, H.× Tsukuda, M.× Okoda, S.× Noda, R.× Tashiro, K.× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | Current crowding of IGBT and power diode in a chip or among chips is a barrier to the realization of highly-reliable power module and power electronics system. Current crowding occurs because of the parasitic inductance, difference of chip characteristics or temperature imbalance among chips. Although current crowding among IGBT or power diode chips has been analysed on numerical simulations, no sensor with sufficiently high special resolution and fast measurement time has yet been demonstrated. Therefore, the author developed and demonstrated 16-channel flat sensitivity sensor array for IGBT current distribution measurement. The sensor array consists of tiny-scale film sensors with analog amps and shield case against noise. The array and digital calibration method will be applied for reliability analysis, designing and screening of IGBT modules. | |||||||||||
備考 | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | ESREF 2015, 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 5-9, 2015, Centre de Congrès Pierre Baudis, Toulouse, France | |||||||||||
書誌情報 |
Microelectronics Reliability 巻 55, 号 9-10, p. 1357-1362, 発行日 2015-08-18 |
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出版社 | ||||||||||||
出版者 | Elsevier | |||||||||||
DOI | ||||||||||||
関連タイプ | isVersionOf | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | https://doi.org/10.1016/j.microrel.2015.06.045 | |||||||||||
NCID | ||||||||||||
収録物識別子タイプ | NCID | |||||||||||
収録物識別子 | AA11538014 | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | ISSN | |||||||||||
収録物識別子 | 0026-2714 | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | Copyright (c) 2015 Elsevier Ltd. | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | IGB | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Current distribution | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Current crowding | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Film sensor | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Reliability analysis | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Magnetic flux | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Digital calibration | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Flat sensitivity | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
査読の有無 | ||||||||||||
値 | yes | |||||||||||
連携ID | ||||||||||||
5585 |