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アイテム
Multi-Cycle Test with Partial Observation on Scan-Based BIST Structure
http://hdl.handle.net/10228/00006381
http://hdl.handle.net/10228/00006381da98280b-be73-4baa-8e06-e5b3f821c77a
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
ats_54_59.pdf (296.0 kB)
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-09-21 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
| 資源タイプ | conference paper | |||||
| タイトル | ||||||
| タイトル | Multi-Cycle Test with Partial Observation on Scan-Based BIST Structure | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Sato, Yasuo
× Sato, Yasuo× 梶原, 誠司× Yamaguchi, Hisato× Matsuzono, Makoto |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Field test for reliability is usually performed with small amount of memory resource, and it requires a new technique which might be somewhat different from the conventional manufacturing tests. This paper proposes a novel technique that improves fault coverage or reduces the number of test vectors that is needed for achieving the given fault coverage on scan-based BIST structure. We evaluate a multi-cycle test method that observes the values of partial flip-flops on a chip during capture-mode. The experimental result shows that the partial observation achieves fault coverage improvement with small hardware overhead than the full observation. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 2011 Asian Test Symposium (ATS), 20-23 Nov. 2011, New Delhi, India | |||||
| 書誌情報 |
en : Asian Test Symposium (ATS), 2011 IEEE 20th p. 54-59, 発行日 2011-12-29 |
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| 出版社 | ||||||
| 出版社 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/ATS.2011.34 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 2377-5386 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1081-7735 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | scan-based BIST | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | BIST | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | multi-cycle test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | multiple observation | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | partial observation | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10227031 | |||||
| 連携ID | ||||||
| 値 | 4479 | |||||
