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A Novel Per-Test Fault Diagnosis Method Based On the Extended X-Fault Model for Deep-Submicron LSI Circuits
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ietisy_e91-d.3.667.pdf (2.1 MB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-01-15 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
タイトル | A Novel Per-Test Fault Diagnosis Method Based On the Extended X-Fault Model for Deep-Submicron LSI Circuits | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
Yamato, Yuta
× Yamato, Yuta× Nakamura, Yusuke× 宮瀬, 紘平
WEKO
6567
× 温, 暁青
WEKO
1143
× 梶原, 誠司
WEKO
1147
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of non-deterministic logic behavior. However, the extensive use of vias and buffers in a deep-submicron circuit and the unpredictable order relation among threshold voltages at the fanout branches of a gate have not been fully addressed by conventional per-test X-fault diagnosis. To take these factors into consideration, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and buffers and (2) the use of occurrence probabilities of logic behaviors for a physical defect to handle the unpredictable relation among threshold voltages. Experimental results show the effectiveness of the proposed method. | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E91.D, 号 3, p. 667-674, 発行日 2008-03-01 |
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言語 | ja | |||||||||||||||||||||||
出版者 | 電子情報通信学会 | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | https://doi.org/10.1093/ietisy/e91-d.3.667 | |||||||||||||||||||||||
CRID | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||||||||
関連識別子 | https://cir.nii.ac.jp/crid/1390282679353965696 | |||||||||||||||||||||||
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関連タイプ | isIdenticalTo | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 549 | |||||||||||||||||||||||
NCID | ||||||||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||||||||
収録物識別子 | AA10826272 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | EISSN | |||||||||||||||||||||||
収録物識別子 | 1745-1361 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | PISSN | |||||||||||||||||||||||
収録物識別子 | 0916-8532 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2008 The Institute of Electronics, Information and Communication Engineers | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | fault diagnosis | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | X-fault model | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | per-test | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | via | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | VoR | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10029820 | ||||||||||||||||||||||||
連携ID | ||||||||||||||||||||||||
8037 | ||||||||||||||||||||||||
著者別名 |