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Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures
http://hdl.handle.net/10228/00007535
http://hdl.handle.net/10228/0000753586a3a178-8c90-47db-ad8a-0ddb2ddf7aa2
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
transinf.2015EDP7289.pdf (2.1 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-01-16 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Chen, Tian
× Chen, Tian× Shen, Dandan× Yi, Xin× Liang, Huaguo× 温, 暁青× Wang, Wei |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. However, the test patterns generated by LFSR reseeding generally have high toggle rate and thus cause high test power. Therefore, it is feasible to fill X bits in deterministic test cubes with 0 or 1 properly before encoding the seed to reduce toggle rate. However, X-filling will increase the number of specified bits, thus increase the difficulty of seed encoding, what's more, the size of LFSR will increase as well. This paper presents a test frame which takes into consideration both compression ratio and power consumption simultaneously. In the first stage, the proposed reseeding-oriented X-filling proceeds for shift power (shift filling) and capture power (capture filling) reduction. Then, encode the filled test cubes using the proposed Compatible Block Code (CBC). The CBC can X-ize specified bits, namely turning specified bits into X bits, and can resolve the conflict between low-power filling and seed encoding. Experiments performed on ISCAS'89 benchmark circuits show that our scheme attains a compression ratio of 94.1% and reduces capture power by at least 15% and scan-in power by more than 79.5%. | |||||
| 言語 | en | |||||
| 書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E99.D, 号 11, p. 2672-2681, 発行日 2016-11-01 |
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| 出版社 | ||||||
| 出版者 | 電子情報通信学会 | |||||
| 言語 | ja | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1587/transinf.2015EDP7289 | |||||
| CRID | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://cir.nii.ac.jp/crid/1390282679355791232 | |||||
| NCID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA10826272 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 1745-1361 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 0916-8532 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2016 The Institute of Electronics, Information and Communication Engineers | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | low power test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | data compression | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | LFSR | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | X-filling | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10302948 | |||||
| 連携ID | ||||||
| 値 | 8047 | |||||
