{"_buckets": {"deposit": "4fe82e8d-6b89-4e43-a34c-00709955de5c"}, "_deposit": {"created_by": 3, "id": "852", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "852"}, "status": "published"}, "_oai": {"id": "oai:kyutech.repo.nii.ac.jp:00000852", "sets": ["19"]}, "author_link": ["3142"], "item_24_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2005-01-01", "bibliographicIssueDateType": "Issued"}, "bibliographic_titles": [{"bibliographic_title": "Technical Report in Computer Science and Systems Engineering"}]}]}, "item_24_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Concerning disruptive discharge in insulation, some statistical methods with the step-up test procedure have been recently proposed. The present paper aims to clarify the differences between the methods and the conventional methods provided by International Electrotechnical Commission, and fairly evaluate their performance in the mathematical or practical aspect. As a result, it is shown that depending on the assumption of statistical independence, the successive discharge method or the modified up-and-down method is the most practical.", "subitem_description_type": "Abstract"}]}, "item_24_description_60": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "Technical Report", "subitem_description_type": "Other"}]}, "item_24_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "3142", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "20285430", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000020285430/"}, {"nameIdentifier": "7101844227", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7101844227"}, {"nameIdentifier": "241", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/241_ja.html"}], "names": [{"name": "小守, 良雄"}]}]}, "item_24_link_61": {"attribute_name": "研究者情報", "attribute_value_mlt": [{"subitem_link_text": "https://hyokadb02.jimu.kyutech.ac.jp/html/241_ja.html", "subitem_link_url": "https://hyokadb02.jimu.kyutech.ac.jp/html/241_ja.html"}]}, "item_24_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "九州工業大学"}]}, "item_24_relation_41": {"attribute_name": "異版である", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1002/tee.20330", "subitem_relation_type_select": "URI"}}]}, "item_24_rights_13": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "[Remark] The material in this report has been superseded by the following paper: Y. Komori (2008), Statistical analysis related to impulse tests for self-restoring insulation, IEEJ Transactions on Electrical and Electronic Engineering, 3 (6), 680-687."}]}, "item_24_source_id_8": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1344-8803", "subitem_source_identifier_type": "ISSN"}]}, "item_24_text_37": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "Department of Systems Innovation and Informatics Kyushu Institute of Technology"}, {"subitem_text_value": "九州工業大学情報工学部 システム創成情報工学科"}]}, "item_24_text_58": {"attribute_name": "テクニカルレポートNo.", "attribute_value_mlt": [{"subitem_text_value": "CSSE-23"}]}, "item_24_text_63": {"attribute_name": "業績ID", "attribute_value_mlt": [{"subitem_text_value": "65F0B3D730EE2F7149257559000E392D"}]}, "item_24_version_type_59": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Komori, Yoshio"}], "nameIdentifiers": [{"nameIdentifier": "3142", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "20285430", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000020285430/"}, {"nameIdentifier": "7101844227", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7101844227"}, {"nameIdentifier": "241", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/241_ja.html"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2009-02-10"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "csse-23.pdf", "filesize": [{"value": "186.1 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 186100.0, "url": {"label": "csse-23.pdf", "url": "https://kyutech.repo.nii.ac.jp/record/852/files/csse-23.pdf"}, "version_id": "2a6dba6e-ad47-417c-955e-ff99c47b6b4e"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "technical report", "resourceuri": "http://purl.org/coar/resource_type/c_18gh"}]}, "item_title": "Statistical Tests and Analysis Related to Disruptive Discharge", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Statistical Tests and Analysis Related to Disruptive Discharge"}]}, "item_type_id": "24", "owner": "3", "path": ["19"], "permalink_uri": "http://hdl.handle.net/10228/1270", "pubdate": {"attribute_name": "公開日", "attribute_value": "2009-02-10"}, "publish_date": "2009-02-10", "publish_status": "0", "recid": "852", "relation": {}, "relation_version_is_last": true, "title": ["Statistical Tests and Analysis Related to Disruptive Discharge"], "weko_shared_id": 3}