WEKO3
アイテム
{"_buckets": {"deposit": "d2ec17e9-0e6c-4a65-9d26-eabc0dff50d7"}, "_deposit": {"created_by": 3, "id": "234", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "234"}, "status": "published"}, "_oai": {"id": "oai:kyutech.repo.nii.ac.jp:00000234", "sets": ["18"]}, "author_link": ["1143"], "item_22_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007-05", "bibliographicIssueDateType": "Issued"}, "bibliographic_titles": [{}]}]}, "item_22_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "平成17年度~平成18年度科学研究費補助金(基盤研究(c))研究成果報告書", "subitem_description_type": "Other"}]}, "item_22_description_61": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "Research Paper", "subitem_description_type": "Other"}]}, "item_22_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"affiliations": [{"affiliationNames": [{"affiliationName": "", "lang": "ja"}], "nameIdentifiers": []}], "familyNames": [{"familyName": "Wen", "familyNameLang": "en"}, {"familyName": "温", "familyNameLang": "ja"}, {"familyName": "オン", "familyNameLang": "ja-Kana"}], "givenNames": [{"givenName": "Xiaoqing", "givenNameLang": "en"}, {"givenName": "暁青", "givenNameLang": "ja"}, {"givenName": "ギョウセイ", "givenNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "1143", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "20250897", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000020250897"}, {"nameIdentifier": "7201738030", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7201738030"}, {"nameIdentifier": "300", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}], "names": [{"name": "Wen, Xiaoqing", "nameLang": "en"}, {"name": "温, 暁青", "nameLang": "ja"}, {"name": "オン, ギョウセイ", "nameLang": "ja-Kana"}]}]}, "item_22_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "九州工業大学"}]}, "item_22_select_60": {"attribute_name": "査読の有無", "attribute_value_mlt": [{"subitem_select_item": "no"}]}, "item_22_text_37": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "九州工業大学大学院情報工学研究科"}]}, "item_22_text_58": {"attribute_name": "科研課題番号", "attribute_value_mlt": [{"subitem_text_value": "17500039"}]}, "item_22_text_62": {"attribute_name": "備考", "attribute_value_mlt": [{"subitem_text_value": "別刷論文(p8-9,17-20,34-39,41-46,48-59,62-69,82-89,92-97,99-104)削除 / 登録別刷論文(1)Hybrid fault simulation with compiled and event-driven methods. Proc. IEEE Int\u00271 Conf. on Design \u0026 Test of Integrated System in Nanoscale Technology (DTIS), pp.240-243 (2006) © 2006 IEEE / 登録別刷論文(2)A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. Proc. IEEE Int\u00271 Test Conf. Paper 17.2 (2006) © 2006 IEEE / 登録別刷論文(3)Low-Capture-Power Test Generation for Scan-Based At-Speed Testing. Proc. IEEE Int\u00271 Test Conf. Paper 39.2 (2005) © 2006 IEEE"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorAffiliations": [{"affiliationNameIdentifiers": [], "affiliationNames": [{"affiliationName": "", "affiliationNameLang": "ja"}]}], "creatorNames": [{"creatorName": "Wen, Xiaoqing", "creatorNameLang": "en"}, {"creatorName": "温, 暁青", "creatorNameLang": "ja"}, {"creatorName": "オン, ギョウセイ", "creatorNameLang": "ja-Kana"}], "familyNames": [{"familyName": "Wen", "familyNameLang": "en"}, {"familyName": "温", "familyNameLang": "ja"}, {"familyName": "オン", "familyNameLang": "ja-Kana"}], "givenNames": [{"givenName": "Xiaoqing", "givenNameLang": "en"}, {"givenName": "暁青", "givenNameLang": "ja"}, {"givenName": "ギョウセイ", "givenNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "1143", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "20250897", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000020250897"}, {"nameIdentifier": "7201738030", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7201738030"}, {"nameIdentifier": "300", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2007-12-07"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "17500039seika.pdf", "filesize": [{"value": "3.0 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 3000000.0, "url": {"label": "17500039seika.pdf", "url": "https://kyutech.repo.nii.ac.jp/record/234/files/17500039seika.pdf"}, "version_id": "2db32ee5-23a9-4b92-bfa4-41ced89cdd79"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "LST Testing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Power Aware Testing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "DFT", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Fault Diagnosis", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Low Power Testing", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "research report", "resourceuri": "http://purl.org/coar/resource_type/c_18ws"}]}, "item_title": "LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究"}]}, "item_type_id": "22", "owner": "3", "path": ["18"], "permalink_uri": "http://hdl.handle.net/10228/478", "pubdate": {"attribute_name": "公開日", "attribute_value": "2007-12-07"}, "publish_date": "2007-12-07", "publish_status": "0", "recid": "234", "relation": {}, "relation_version_is_last": true, "title": ["LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究"], "weko_shared_id": 3}
LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究
http://hdl.handle.net/10228/478
http://hdl.handle.net/10228/4787d3959e4-8358-48e2-ae2a-2f24f94a3ea5
名前 / ファイル | ライセンス | アクション |
---|---|---|
17500039seika.pdf (3.0 MB)
|
|
Item type | 研究報告書 = Research Paper(1) | |||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
公開日 | 2007-12-07 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_18ws | |||||||||||
資源タイプ | research report | |||||||||||
タイトル | ||||||||||||
タイトル | LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究 | |||||||||||
言語 | ||||||||||||
言語 | jpn | |||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
|
|||||||||||
備考 | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | 平成17年度~平成18年度科学研究費補助金(基盤研究(c))研究成果報告書 | |||||||||||
書誌情報 | 発行日 2007-05 | |||||||||||
出版社 | ||||||||||||
出版者 | 九州工業大学 | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | LST Testing | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Power Aware Testing | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | DFT | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Fault Diagnosis | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Low Power Testing | |||||||||||
査読の有無 | ||||||||||||
値 | no | |||||||||||
科研課題番号 | ||||||||||||
17500039 | ||||||||||||
著者所属 | ||||||||||||
九州工業大学大学院情報工学研究科 | ||||||||||||
備考 | ||||||||||||
別刷論文(p8-9,17-20,34-39,41-46,48-59,62-69,82-89,92-97,99-104)削除 / 登録別刷論文(1)Hybrid fault simulation with compiled and event-driven methods. Proc. IEEE Int'1 Conf. on Design & Test of Integrated System in Nanoscale Technology (DTIS), pp.240-243 (2006) © 2006 IEEE / 登録別刷論文(2)A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. Proc. IEEE Int'1 Test Conf. Paper 17.2 (2006) © 2006 IEEE / 登録別刷論文(3)Low-Capture-Power Test Generation for Scan-Based At-Speed Testing. Proc. IEEE Int'1 Test Conf. Paper 39.2 (2005) © 2006 IEEE |