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A New ATPG Method for Efficient Capture Power Reduction During Scan Testing
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10056666.pdf (282.1 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-01-30 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
タイトル | A New ATPG Method for Efficient Capture Power Reduction During Scan Testing | |||||||||||||||||||||||
その他のタイトル | ||||||||||||||||||||||||
その他のタイトル | A new ATPG method for efficient capture power reduction during scan testing | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
× 梶原, 誠司
WEKO
1147
× 宮瀬, 紘平
WEKO
6567
× Suzuki, Tatsuya× Saluja, Kewal K.× Wang, Laung-Terng× Abdel-Hafez, Khader S.× Kinoshita, Kozo |
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | High power dissipation can occur when the response to a test vector is captured by flip-flops in scan testing, resulting in excessive JR drop, which may cause significant capture-induced yield loss in the DSM era. This paper addresses this serious problem with a novel test generation method, featuring a unique algorithm that deterministically generates test cubes not only for fault detection but also for capture power reduction. Compared with previous methods that passively conduct X-filling for unspecified bits in test cubes generated only for fault detection, the new method achieves more capture power reduction with less test set inflation. Experimental results show its effectiveness | |||||||||||||||||||||||
備考 | ||||||||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | 24th IEEE VLSI Test Symposium (VTS'06), 30 April-4 May 2006, Berkeley, CA, USA | |||||||||||||||||||||||
書誌情報 |
24th IEEE VLSI Test Symposium p. 58-63, 発行日 2006-05-15 |
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出版社 | ||||||||||||||||||||||||
出版者 | IEEE | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | info:doi/10.1109/VTS.2006.8 | |||||||||||||||||||||||
ISBN | ||||||||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||||||||
関連識別子 | 0-7695-2514-8 | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 549 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 1093-0167 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 2375-1053 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Automatic test pattern generation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Circuit testing | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Power dissipation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Automatic testing | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Sequential analysis | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Power generation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Sequential circuits | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Clocks | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Flip-flops | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Integrated circuit testing | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | AM | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10056666 | ||||||||||||||||||||||||
連携ID | ||||||||||||||||||||||||
8090 | ||||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wen, Xiaoqing | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 温, 暁青 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | オン, ギョウセイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kajihara, Seiji | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 梶原, 誠司 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | カジハラ, セイジ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Miyase, Kohei | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 宮瀬, 紘平 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | ミヤセ, コウヘイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Suzuki, T. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Saluja, K. K. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wang, L.-T. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Abdel-Hafez, K. S. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kinoshita, K. | |||||||||||||||||||||||
情報源 | ||||||||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||||||||
関連識別子 | DOI: 10.1109/VTS.2006.8 | |||||||||||||||||||||||
関連名称 | DOI: 10.1109/VTS.2006.8 |