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An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits
名前 / ファイル | ライセンス | アクション |
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10056657.pdf (1.6 MB)
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Item type | 会議発表論文 = Conference Paper(1) | |||||||||||||||||||||||
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公開日 | 2020-02-03 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||||||||||||||
資源タイプ | conference paper | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
タイトル | An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
× Yamato, Yuta× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司
WEKO
1147
× Furukawa, Hiroshi× Wang, Laung-Terng× Saluja, Kewal K.× Kinoshita, Kozo |
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of nondeterministic logic behavior. However, the extensive use of vias and the unpredictable order relation among threshold voltages at fanout branches, both being typical phenomena in a deep-submicron circuit, have not been fully addressed by conventional per-test X-fault diagnosis. To solve these problems, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and (2) occurrence probabilities of logic behavior for a physical defect to handle the unpredictable relation among threshold voltages. Experimental result show the effectiveness of the proposed method. | |||||||||||||||||||||||
備考 | ||||||||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | 7th Workshop on RTL and High Level Testing (WRTLT`06), November 23-24, 2006, Fukuoka, Japan | |||||||||||||||||||||||
書誌情報 |
7th Workshop on RTL and High Level Testing (WRTLT`06) p. 55-60, 発行日 2006-11-23 |
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出版社 | WRTLT`06 | |||||||||||||||||||||||
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出版タイプ | VoR | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10056657 | ||||||||||||||||||||||||
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8100 | ||||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wen, X. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Yamato, Y. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Miyase, K. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kajihara, S. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Furukawa, H. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wang, L.-T. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Saluja, K. K. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kinoshita, K. |