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アイテム
An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits
http://hdl.handle.net/10228/00007586
http://hdl.handle.net/10228/000075860a27aa5d-1895-4a26-b62d-3700319e61bf
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10056657.pdf (1.6 MB)
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||||||||
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| 公開日 | 2020-02-03 | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| タイトル | ||||||||||||
| タイトル | An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits | |||||||||||
| 言語 | en | |||||||||||
| 言語 | ||||||||||||
| 言語 | eng | |||||||||||
| 著者 |
温, 暁青
× 温, 暁青× Yamato, Yuta× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司× Furukawa, Hiroshi× Wang, Laung-Terng× Saluja, Kewal K.× Kinoshita, Kozo |
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| 抄録 | ||||||||||||
| 内容記述タイプ | Abstract | |||||||||||
| 内容記述 | Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of nondeterministic logic behavior. However, the extensive use of vias and the unpredictable order relation among threshold voltages at fanout branches, both being typical phenomena in a deep-submicron circuit, have not been fully addressed by conventional per-test X-fault diagnosis. To solve these problems, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and (2) occurrence probabilities of logic behavior for a physical defect to handle the unpredictable relation among threshold voltages. Experimental result show the effectiveness of the proposed method. | |||||||||||
| 言語 | en | |||||||||||
| 備考 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 7th Workshop on RTL and High Level Testing (WRTLT`06), November 23-24, 2006, Fukuoka, Japan | |||||||||||
| 書誌情報 |
en : 7th Workshop on RTL and High Level Testing (WRTLT`06) p. 55-60, 発行日 2006-11-23 |
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| 出版社 | ||||||||||||
| 出版社 | WRTLT`06 | |||||||||||
| 出版タイプ | ||||||||||||
| 出版タイプ | VoR | |||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||
| 査読の有無 | ||||||||||||
| 値 | yes | |||||||||||
| 研究者情報 | ||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||||||||
| 論文ID（連携） | ||||||||||||
| 値 | 10056657 | |||||||||||
| 連携ID | ||||||||||||
| 値 | 8100 | |||||||||||
