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Mosaic SRAM Cell TEGs with intentionally-added device variability for confirming the ratio-less SRAM operation
http://hdl.handle.net/10228/00007547
http://hdl.handle.net/10228/00007547bbeedcb6-3ea3-43dd-9710-34e9152753e8
名前 / ファイル | ライセンス | アクション |
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10245959.pdf (1.0 MB)
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Item type | 会議発表論文 = Conference Paper(1) | |||||||||||
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公開日 | 2020-01-21 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
資源タイプ | conference paper | |||||||||||
タイトル | ||||||||||||
言語 | en | |||||||||||
タイトル | Mosaic SRAM Cell TEGs with intentionally-added device variability for confirming the ratio-less SRAM operation | |||||||||||
その他のタイトル | ||||||||||||
その他のタイトル | Mosaic SRAM Cell TEGs with Intentionally-added Device Variability for Confirming the Ratio-less SRAM Operation | |||||||||||
言語 | en | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
Okamura, Hitoshi
× Okamura, Hitoshi× Saito, Takahiko× Goto, Hiroaki× Yamamoto, Masahiro× 中村, 和之
WEKO
26231
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | MOSAIC SRAM Cell TEGs consisting of memory cells having all combinations of gate sizes of transistors differing by two orders of magnitude were developed with 0.18 μm CMOS process to verify the operation margins for SRAM circuits. The measured results show the operation of the ratio-less SRAM is completely independent of the size of transistors in the memory cell. | |||||||||||
言語 | en | |||||||||||
備考 | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | IEEE International Conference on Microelectronic Test Structures (ICMTS 2013), 25-28 March 2013, Osaka, Japan | |||||||||||
書誌情報 |
en : 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) 発行日 2013-06-13 |
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出版社 | ||||||||||||
出版社 | IEEE | |||||||||||
DOI | ||||||||||||
関連タイプ | isVersionOf | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | https://doi.org/10.1109/ICMTS.2013.6528174 | |||||||||||
ISBN | ||||||||||||
識別子タイプ | ISBN | |||||||||||
関連識別子 | 978-1-4673-4848-5 | |||||||||||
ISBN | ||||||||||||
識別子タイプ | ISBN | |||||||||||
関連識別子 | 978-1-4673-4845-4 | |||||||||||
ISBN | ||||||||||||
識別子タイプ | ISBN | |||||||||||
関連識別子 | 978-1-4673-4847-8 | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | EISSN | |||||||||||
収録物識別子 | 1071-9032 | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | PISSN | |||||||||||
収録物識別子 | 1071-9032 | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | Copyright (c) 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | SRAM | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Variability | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Ratio-less | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Static Noise Margin | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
査読の有無 | ||||||||||||
値 | yes | |||||||||||
研究者情報 | ||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/381_ja.html | ||||||||||||
論文ID(連携) | ||||||||||||
10245959 | ||||||||||||
連携ID | ||||||||||||
8056 |