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A Scan-Out Power Reduction Method for Multi-Cycle BIST
http://hdl.handle.net/10228/00006256
http://hdl.handle.net/10228/00006256ec07e0a6-ff0d-483e-8734-c1aa181f32ba
| 名前 / ファイル | ライセンス | アクション |
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ats_272_277.pdf (677.8 kB)
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| Item type | 会議発表論文 = Conference Paper(1) | |||||||||||
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| 公開日 | 2017-07-11 | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| タイトル | ||||||||||||
| タイトル | A Scan-Out Power Reduction Method for Multi-Cycle BIST | |||||||||||
| 言語 | en | |||||||||||
| 言語 | ||||||||||||
| 言語 | eng | |||||||||||
| 著者 |
Wang, Senling
× Wang, Senling× Sato, Yasuo× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司 |
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| 抄録 | ||||||||||||
| 内容記述タイプ | Abstract | |||||||||||
| 内容記述 | High test power in logic BIST is a serious problem not only for production test, but also for board test, system debug or field test. Many low power BIST approaches that focus on scan-shift power or capture power have been proposed. However, it is known that a half of scan-shift power is compensated by test responses, which is difficult to control in those approaches. This paper proposes a novel approach that directly reduces scan-out power by modifying some flip-flops' values in scan chains at the last capture. Experimental results show that the proposed method reduces scan-out power up to 30% with little loss of test coverage. | |||||||||||
| 言語 | en | |||||||||||
| 備考 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 2012 IEEE 21st Asian Test Symposium, 19-22 Nov. 2012, Niigata, Japan | |||||||||||
| 書誌情報 |
en : 2012 IEEE 21st Asian Test Symposium p. 272-277, 発行日 2012-12-31 |
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| 出版社 | ||||||||||||
| 出版社 | IEEE | |||||||||||
| DOI | ||||||||||||
| 関連タイプ | isVersionOf | |||||||||||
| 識別子タイプ | DOI | |||||||||||
| 関連識別子 | https://doi.org/10.1109/ATS.2012.50 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||
| 収録物識別子 | 2377-5386 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||
| 収録物識別子 | 1081-7735 | |||||||||||
| 著作権関連情報 | ||||||||||||
| 権利情報 | Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | shift power | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | low power | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | BIST | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | multi-cycle test | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 出版タイプ | ||||||||||||
| 出版タイプ | AM | |||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
| 査読の有無 | ||||||||||||
| 値 | yes | |||||||||||
| 研究者情報 | ||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||||||||
| 論文ID（連携） | ||||||||||||
| 値 | 10282570 | |||||||||||
| 連携ID | ||||||||||||
| 値 | 6198 | |||||||||||
