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Temperature and voltage measurement for field test using an Aging-Tolerant monitor
http://hdl.handle.net/10228/00006260
http://hdl.handle.net/10228/00006260d7895582-ca3a-4d82-85d9-c6d9a6807fd8
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
tvlsis_24_11_3282.pdf (2.8 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2017-07-11 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Temperature and voltage measurement for field test using an Aging-Tolerant monitor | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Miyake, Yousuke
× Miyake, Yousuke× Sato, Yasuo× 梶原, 誠司× Miura, Yukiya |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Measuring temperature and voltage (T&V) in a current VLSI is very important in guaranteeing its reliability, because a large variation of temperature or voltage in field will reduce a delay margin and makes the chip behavior unreliable. This paper proposes a novel method of T&V measurement, which can be used for variety of applications, such as field test, online test, or hot-spot monitoring. The method counts frequencies of more than one ring oscillator (RO), which composes an aging-tolerant monitor. Then, the T&V are derived from the frequencies using a multiple regression analysis. To improve the accuracy of measurement, three techniques of an optimal selection of RO types, their calibration, and hierarchical calculation are newly introduced. In order to make sure the proposed method, circuit simulation in 180-, 90-, and 45-nm CMOS technologies is performed. In the 180-nm CMOS technology, the temperature accuracy is within 0.99 °C, and the voltage accuracy is within 4.17 mV. Furthermore, some experimental results using fabricated test chips with 180-nm CMOS technology confirm its feasibility. | |||||
| 言語 | en | |||||
| 書誌情報 |
en : IEEE Transactions on Very Large Scale Integration (VLSI) Systems 巻 24, 号 11, p. 3282-3295, 発行日 2016-11-01 |
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| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/TVLSI.2016.2540654 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1063-8210 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 1557-9999 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Temperature monitor | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | voltage monitor | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | ring oscillator | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | field test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | delay test | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10303999 | |||||
| 連携ID | ||||||
| 値 | 6192 | |||||
