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A novel scheme to reduce power supply noise for high-quality at-speed scan testing
http://hdl.handle.net/10228/00007587
http://hdl.handle.net/10228/00007587a24549b0-09a7-4e84-b730-31aa350f7b55
| 名前 / ファイル | ライセンス | アクション |
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10056675.pdf (425.9 kB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||||||||
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| 公開日 | 2020-02-03 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | A novel scheme to reduce power supply noise for high-quality at-speed scan testing | |||||||||||||
| 言語 | en | |||||||||||||
| その他のタイトル | ||||||||||||||
| その他のタイトル | A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed Scan Testing | |||||||||||||
| 言語 | en | |||||||||||||
| 言語 | ||||||||||||||
| 言語 | eng | |||||||||||||
| 著者 |
温, 暁青
× 温, 暁青× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司× Suzuki, Tatsuya× Yamato, Yuta× Girard, Patrick× Ohsumi, Yuji× Wang, Laung-Terng |
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| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | High-quality at-speed scan testing, characterized by high small-delay-defect detecting capability, is indispensable to achieve high delay test quality for DSM circuits. However, such testing is susceptible to yield loss due to excessive power supply noise caused by high launch-induced switching activity. This paper addresses this serious problem with a novel and practical post-ATPG X-filling scheme, featuring (1) a test relaxation method, called path keeping X-identification, that finds don't-care bits from a fully-specified transition delay test set while preserving its delay test quality by keeping the longest paths originally sensitized for fault detection, and (2) an X-filling method, called justification-probability-based fill (JP-fill), that is both effective and scalable for reducing launch-induced switching activity. This scheme can be easily implemented into any ATPG flow to effectively reduce power supply noise, without any impact on delay test quality, test data volume, area overhead, and circuit timing. | |||||||||||||
| 言語 | en | |||||||||||||
| 備考 | ||||||||||||||
| 内容記述タイプ | Other | |||||||||||||
| 内容記述 | 2007 IEEE International Test Conference, 21-26 October 2007, Santa Clara, CA, USA | |||||||||||||
| 書誌情報 |
en : 2007 IEEE International Test Conference 発行日 2008-01-22 |
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| 出版社 | ||||||||||||||
| 出版者 | IEEE | |||||||||||||
| DOI | ||||||||||||||
| 関連タイプ | isVersionOf | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1109/TEST.2007.4437632 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-1-4244-1127-6 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-1-4244-1128-3 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 1089-3539 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||
| 収録物識別子 | 2378-2250 | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Copyright (c) 2007 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Power supplies | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Noise reduction | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Circuit testing | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Delay effects | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Timing | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Neodymium | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Lab-on-a-chip | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Circuit noise | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Research and development | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Gas detectors | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | AM | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 研究者情報 | ||||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||||||||||
| 論文ID（連携） | ||||||||||||||
| 値 | 10056675 | |||||||||||||
| 連携ID | ||||||||||||||
| 値 | 8098 | |||||||||||||
