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アイテム
On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression
http://hdl.handle.net/10228/00007589
http://hdl.handle.net/10228/00007589ef2f74b9-8887-4e94-aff4-d063612a1f45
| 名前 / ファイル | ライセンス | アクション |
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10274122.pdf (205.1 kB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||||||||
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| 公開日 | 2020-02-03 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression | |||||||||||||
| 言語 | en | |||||||||||||
| 言語 | ||||||||||||||
| 言語 | eng | |||||||||||||
| 著者 |
Enokimoto, Kazunari
× Enokimoto, Kazunari× 温, 暁青× 宮瀬, 紘平
WEKO
6567
× Huang, Jiun-Lang× 梶原, 誠司× Wang, Laung-Terng |
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| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | Capture safety has become a major concern in at-speed scan testing since strong power supply noise caused by excessive launch switching activity (LSA) at transition launching in an at-speed test cycle often results in severe timing-failure-induced yield loss. Recently, a basic RM (rescue-&-mask) test generation scheme was proposed for guaranteeing capture safety rather than merely reducing LSA to some extent. This paper extends the basic RM scheme to broadcast-scan-based test compression by uniquely solving two test-compression-induced problems, namely (1) input X-bit insufficiency (i.e., fewer input X-bits are available for LSA reduction due to test compression) and (2) output X-bit impact (i.e., output X-bits may reduce fault coverage due to test response compaction). This leads to the broadcast-RM (broadcast-scan-based rescue-&-mask) test generation scheme. Evaluations on large benchmark circuits and an industrial circuit of about 1M gates clearly demonstrate that this novel scheme can indeed guarantee capture safety in at-speed scan testing with broadcast-scan-based test compression while minimizing its impact on both test quality and test costs. | |||||||||||||
| 言語 | en | |||||||||||||
| 備考 | ||||||||||||||
| 内容記述タイプ | Other | |||||||||||||
| 内容記述 | 2013 26th International Conference on VLSI Design, 5-10 January 2013, Pune, India | |||||||||||||
| 書誌情報 |
en : 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems p. 279-284, 発行日 2013-01-05 |
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| 出版社 | ||||||||||||||
| 出版者 | IEEE | |||||||||||||
| DOI | ||||||||||||||
| 関連タイプ | isVersionOf | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1109/VLSID.2013.201 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-1-4673-4639-9 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-0-7695-4889-0 | |||||||||||||
| 日本十進分類法 | ||||||||||||||
| 主題Scheme | NDC | |||||||||||||
| 主題 | 548 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 1063-9667 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||
| 収録物識別子 | 2380-6923 | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Copyright (c) 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | test generation | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | test compression | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | test power | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | at-speed scan testing | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | power supply noise | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | capture safety | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | AM | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 研究者情報 | ||||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||||||||||
| 論文ID（連携） | ||||||||||||||
| 値 | 10274122 | |||||||||||||
| 連携ID | ||||||||||||||
| 値 | 8099 | |||||||||||||
