WEKO3
アイテム
CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing
http://hdl.handle.net/10228/00007593
http://hdl.handle.net/10228/00007593732e201c-176c-42a2-91fb-5d5ae0f55fdf
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10056692.pdf (423.2 kB)
|
|
| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 公開日 | 2020-02-04 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing | |||||||||||||
| 言語 | en | |||||||||||||
| 言語 | ||||||||||||||
| 言語 | eng | |||||||||||||
| 著者 |
Enokimoto, K.
× Enokimoto, K.× 温, 暁青× Yamato, Y.× 宮瀬, 紘平
WEKO
6567
× Sone, H.× 梶原, 誠司× Aso, M.× Furukawa, H. |
|||||||||||||
| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | Reducing excessive launch switching activity (LSA) is now mandatory in at-speed scan testing for avoiding test-induced yield loss, and test set modification is preferable for this purpose. However, previous low-LSA test set modification methods may be ineffective since they are not targeted at reducing launch switching activity in the areas around long sensitized paths, which are spatially and temporally critical for test-induced yield loss. This paper proposes a novel CAT (Critical-Area-Targeted) low-LSA test modification scheme, which uses long sensitized paths to guide launch-safety checking, test relaxation, and X-filling. As a result, launch switching activity is reduced in a pinpoint manner, which is more effective for avoiding test-induced yield loss. Experimental results on industrial circuits demonstrate the advantage of the CAT scheme for reducing launch switching activity in at-speed scan testing. | |||||||||||||
| 言語 | en | |||||||||||||
| 備考 | ||||||||||||||
| 内容記述タイプ | Other | |||||||||||||
| 内容記述 | 2009 Asian Test Symposium, 23-26 November 2009, Taichung, Taiwan | |||||||||||||
| 書誌情報 |
en : 2009 Asian Test Symposium p. 99-104, 発行日 2009-12-28 |
|||||||||||||
| 出版社 | ||||||||||||||
| 出版者 | IEEE | |||||||||||||
| DOI | ||||||||||||||
| 関連タイプ | isVersionOf | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1109/ATS.2009.22 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-0-7695-3864-8 | |||||||||||||
| 日本十進分類法 | ||||||||||||||
| 主題Scheme | NDC | |||||||||||||
| 主題 | 548 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 1081-7735 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||
| 収録物識別子 | 2377-5386 | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Copyright (c) 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Power Supply Noise | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Test Relaxation | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | X-Filling | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Clock-Gating | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | AM | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 研究者情報 | ||||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||||||||||
| 論文ID（連携） | ||||||||||||||
| 値 | 10056692 | |||||||||||||
| 連携ID | ||||||||||||||
| 値 | 8103 | |||||||||||||
