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On Pinpoint Capture Power Management in At-Speed Scan Test Generation
http://hdl.handle.net/10228/00007598
http://hdl.handle.net/10228/00007598f171568a-c815-4aca-950f-586cc2f49d50
| 名前 / ファイル | ライセンス | アクション |
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10274125.pdf (1.4 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||||||||
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| 公開日 | 2020-02-05 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | On Pinpoint Capture Power Management in At-Speed Scan Test Generation | |||||||||||||
| 言語 | en | |||||||||||||
| その他のタイトル | ||||||||||||||
| その他のタイトル | On pinpoint capture power management in at-speed scan test generation | |||||||||||||
| 言語 | en | |||||||||||||
| 言語 | ||||||||||||||
| 言語 | eng | |||||||||||||
| 著者 |
温, 暁青
× 温, 暁青× Nishida, Y.× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司× Girard, P.× Tehranipoor, M.× Wang, L.-T. |
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| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | This paper proposes a novel scheme to manage capture power in a pinpoint manner for achieving guaranteed capture power safety, improved small-delay test capability, and minimal test cost impact in at-speed scan test generation. First, switching activity around each long path sensitized by a test vector is checked to characterize it as hot (with excessively-high switching activity), warm (with normal/functional switching activity), or cold (with excessively-low switching activity). Then, X-restoration/X-filling-based rescue is conducted on the test vector to reduce switching activity around hot paths. If the rescue is insufficient to turn a hot path into a warm path, mask is then conducted on expected test response data to instruct the tester to ignore the potentially-false test response value from the hot path, thus achieving guaranteed capture power safety. Finally, X-restoration/X-filling-based warm-up is conducted on the test vector to increase switching activity around cold paths for improving their small-delay test capability. This novel approach of pinpoint capture power management has significant advantages over the conventional approach of global capture power management, as demonstrated by evaluation results on large ITC'99 benchmark circuits and detailed path delay analysis. | |||||||||||||
| 言語 | en | |||||||||||||
| 備考 | ||||||||||||||
| 内容記述タイプ | Other | |||||||||||||
| 内容記述 | 2012 IEEE International Test Conference, 5-8 November 2012, Anaheim, CA, USA | |||||||||||||
| 書誌情報 |
en : 2012 IEEE International Test Conference 発行日 2013-01-07 |
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| 出版社 | ||||||||||||||
| 出版者 | IEEE | |||||||||||||
| DOI | ||||||||||||||
| 関連タイプ | isVersionOf | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1109/TEST.2012.6401548 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-1-4673-1595-1 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-1-4673-1594-4 | |||||||||||||
| ISBN | ||||||||||||||
| 識別子タイプ | ISBN | |||||||||||||
| 関連識別子 | 978-1-4673-1593-7 | |||||||||||||
| 日本十進分類法 | ||||||||||||||
| 主題Scheme | NDC | |||||||||||||
| 主題 | 548 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 1089-3539 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||
| 収録物識別子 | 2378-2250 | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Delay | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Switches | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Vectors | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Safety | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Clocks | |||||||||||||
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| 主題Scheme | Other | |||||||||||||
| 主題 | Testing | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | AM | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 研究者情報 | ||||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||||||||||
| 論文ID（連携） | ||||||||||||||
| 値 | 10274125 | |||||||||||||
| 連携ID | ||||||||||||||
| 値 | 8106 | |||||||||||||
