WEKO3
アイテム
Path Delay Measurement with Correction for Temperature And Voltage Variations
http://hdl.handle.net/10228/00008155
http://hdl.handle.net/10228/00008155a2d8b1b3-fcc7-45ba-b78a-4e04cd414925
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10362957.pdf (2.1 MB)
|
|
| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2021-04-08 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Path Delay Measurement with Correction for Temperature And Voltage Variations | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Miyake, Yousuke
× Miyake, Yousuke× Kato, Takaaki× 梶原, 誠司 |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Path delay measurement in field is useful for not only detection of delay-related faults but also prediction of aging-induced delay faults. In order to utilize the delay measurement results for fault detection and fault prediction, the measured delay must be corrected because the circuit delay is varied in field due to environment such as temperature or voltage variations. This paper proposes a method of BIST-based path delay measurement in which the influence of environmental variations is eliminated. An on-chip sensor measures temperature and voltage during delay measurement. Using information from the temperature and voltage sensor and pre-computed temperature and voltage sensitivities of the circuit delay, the measured delay value is corrected to a delay value that would be obtained under a fixed temperature and voltage. Evaluation for a test chip with 65nm CMOS technology implementing the proposed method shows that errors of measured delays brought by environmental variations could be reduced from 2419 to 211 ps in the range of 30 to 80 °C and 1.05 to 1.35 V. This paper also discusses application and feasibility for degradation detection of the proposed method. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | International Test Conference in Asia (ITC-Asia 2020), September 23-25, 2020, Taipei City, Taiwan（現地およびオンラインで開催） | |||||
| 書誌情報 |
en : 2020 IEEE International Test Conference in Asia (ITC-Asia) p. 112-117, 発行日 2020-10-16 |
|||||
| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/ITC-Asia51099.2020.00031 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-8944-4 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-8945-1 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 549 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Field test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Logic BIST | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Delay measurement | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Degradation detection | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Temperature and voltage variation | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10362957 | |||||
| 連携ID | ||||||
| 値 | 8667 | |||||
