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Investigation of Relation between EFTB Test and RF Conductive Immunity Test Using BER and Baseband Signal
http://hdl.handle.net/10228/00008537
http://hdl.handle.net/10228/0000853772625eed-945f-4b28-8287-0a4c66b73d25
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
JKIEES.2011.11.4.274.pdf (2.6 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2021-11-12 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Investigation of Relation between EFTB Test and RF Conductive Immunity Test Using BER and Baseband Signal | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
桑原, 伸夫
× 桑原, 伸夫× Irie, Yasuhiro× Hirasawa, Norihito× Akiyama, Yoshiharu |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | High-speed telecommunication systems are influenced by electromagnetic environments because they need a wide bandwidth to transmit signals. Immunity tests of telecommunication equipment are effective for improving its immunity to electromagnetic environments. However, immunity tests are expensive to carry out because there are several different tests. The correlation among the tests should therefore be examined in order to reduce the kinds of tests that are necessary. This paper investigates the correlation between the electrical fast transient/burst (EFTB) test and the radio frequency (RF) conductive immunity test. Imitation equipment was constructed with a balun, and a baseband signal was transmitted from the associated equipment to the imitation equipment. Then, disturbances were applied to the equipment, and the telecommunication quality was evaluated by using the bit error rate (BER). The results from the EFTB test indicated that the BER was less than 6×10 −5 and the value was independent of the peak value. The results from the RF conductive immunity test indicated that the BER was affected by the longitudinal conversion loss (LCL). | |||||
| 言語 | en | |||||
| 書誌情報 |
Journal of Korean Institute of Electromagnetic Engineering and Science 巻 11, 号 4, p. 274-281, 発行日 2011-12-31 |
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| 出版社 | ||||||
| 出版者 | Korean Institute of Electromagnetic Engineering and Science | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.5515/JKIEES.2011.11.4.274 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 547 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 2671-7255 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 2671-7263 | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | EFTB | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | RF Conductive Immunity | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Bit Error Rate | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Base Band Signal | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Longitudinal Conversion Loss (LCL) | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 連携ID | ||||||
| 値 | 9759 | |||||
