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Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation
http://hdl.handle.net/10228/984
http://hdl.handle.net/10228/98429bd046c-c4f7-47b3-a4d6-8b218a06eb41
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
Maximum_20080212155426_001.pdf (3.2 MB)
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| Item type | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2008-02-14 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
廣瀬, 英雄
× 廣瀬, 英雄 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Although the Weibull distribution is widely used in a variety of reliability applications, difficulties in its treatment, particularly in three parameter cases in the maximum likelihood estimation, hinder us from using the distribution. The extended Weibull distribution proposed by Marshall and Olkin (1997) can avoid the difficulties which appear in the conventional Weibull distribution models. This paper shows the maximum likelihood estimation method in the extended Weibull distribution model. The paper also illustrates some typical applications for breakdown voltage estimation in which the extended models are superior to the conventional Weibull models. The central discussion is whether the shape parameters in the extended model accomplish the mass shifting effect of the distribution. | |||||
| 書誌情報 |
IEEE Transactions on Dielectrics and Electrical Insulation 巻 9, 号 4, p. 524-536, 発行日 2002-08 |
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| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | info:doi/10.1109/TDEI.2002.1024429 | |||||
| NAID | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | NAID | |||||
| 関連識別子 | 120002440946 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 541 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1070-9878 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 1558-4135 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | ©2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 情報源 | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | DOI: 10.1109/TDEI.2002.1024429 | |||||
| 関連名称 | DOI: 10.1109/TDEI.2002.1024429 | |||||
