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More accurate breakdown voltage estimation for the new step-up test method in the Weibull model
http://hdl.handle.net/10228/987
http://hdl.handle.net/10228/9879ecc70d6-afe3-4af9-88de-eeba5ead143d
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2008-02-19 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | More accurate breakdown voltage estimation for the new step-up test method in the Weibull model | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
廣瀬, 英雄
× 廣瀬, 英雄 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The estimation problems for the conventional step-up method (the observed breakdown voltages are not given at all) and the new step-up method (some of the observed breakdown voltages are given) are analyzed when the underlying probability distribution is assumed to be a Weibull model. This paper is a consecutive research of the case that the underlying probability distribution is assumed to be a normal model. Similarly to the normal model, the new step-up test method, in the Weibull model, also has advantages compared to the conventional method: (1) the confidence intervals of the estimates become smaller and (2) the estimates can be obtained with higher probability. The bias observed when sample size is small can be reduced by using the bootstrap method. | |||||
| 書誌情報 |
IEEE Transactions on Dielectrics and Electrical Insulation 巻 11, 号 3, p. 418-423, 発行日 2004-06 |
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| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/TDEI.2004.1306720 | |||||
| NAID | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | NAID | |||||
| 関連識別子 | 120002440949 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 541 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1070-9878 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 1558-4135 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | ©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||