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STAHL: A Novel Scan-Test-Aware Hardened Latch Design
http://hdl.handle.net/10228/00007625
http://hdl.handle.net/10228/00007625cb6bbfc5-c885-422a-af7a-398f0b335a8a
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10348529.pdf (756.6 kB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-02-19 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | STAHL: A Novel Scan-Test-Aware Hardened Latch Design | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Ma, Ruijun
× Ma, Ruijun× ホルスト, シュテファン× 温, 暁青× Yan, Aibin× Xu, Hui |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | As modern technology nodes become more susceptible to soft errors, many radiation hardened latch designs have been proposed. However, redundant circuitry used to tolerate soft errors in such hardened latches also reduces the test coverage of cell-internal manufacturing defects. To avoid potential test escapes that lead to soft error vulnerability and reliability issues, this paper proposes a novel Scan-Test-Aware Hardened Latch (STAHL). Simulation results show that STAHL has superior defect coverage compared to previous hardened latches while maintaining full radiation hardening in function mode. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 24th IEEE European Test Symposium (ETS'19), May 27-31, 2019, Baden-Baden, Germany | |||||
| 言語 | en | |||||
| 書誌情報 |
en : 2019 IEEE European Test Symposium (ETS) 発行日 2019-08-08 |
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| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/ETS.2019.8791544 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-1173-5 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 548 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 1558-1780 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | soft error | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | hardened latch | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | defect | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | scan test | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10348529 | |||||
| 連携ID | ||||||
| 値 | 8131 | |||||
