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On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test and Its Application to A Digital Sensor
http://hdl.handle.net/10228/00008146
http://hdl.handle.net/10228/00008146987e12ec-ec1e-4295-93db-f2123266729a
| 名前 / ファイル | ライセンス | アクション |
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10362954.pdf (1.3 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2021-04-07 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test and Its Application to A Digital Sensor | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Gondo, Masayuki
× Gondo, Masayuki× Miyake, Yousuke× Kato, Takaaki× 梶原, 誠司 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | An aging-tolerant ring oscillator (RO) has been proposed for a digital temperature and voltage sensor. This paper discusses on the effectiveness of aging-tolerance of the ROs through accelerated life test for a test chip with 65nm CMOS technology. The progress of delay degradation of the ROs is examined, and influence of delay degradation on measurement accuracy of the sensor is investigated. Experimental results show that the aging-tolerant ROs can mitigate delay degradation, and that the measurement errors of the sensor can be reduced. Compared with a sensor consisting of an aging-intolerant RO, temperature and voltage errors are reduced 2.5°C and 32mV, respectively. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 29th IEEE Asian Test Symposium (ATS'20), November 22-25, 2020, Penang, Malaysia（オンライン開催に変更） | |||||
| 書誌情報 |
en : 2020 IEEE 29th Asian Test Symposium (ATS) 発行日 2020-12-28 |
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| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/ATS49688.2020.9301588 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-7467-9 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-7468-6 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 541 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 2377-5386 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1081-7735 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Temperature and voltage sensor | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Ring Oscillator | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Aging-tolerance | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Accelerated life test | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10362954 | |||||
| 連携ID | ||||||
| 値 | 8664 | |||||
