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On-Chip Delay Measurement for In-Field Test of FPGAs
http://hdl.handle.net/10228/00008152
http://hdl.handle.net/10228/00008152c25ffdaa-9375-4474-b004-373e5350d570
| 名前 / ファイル | ライセンス | アクション |
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10362956.pdf (639.7 kB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2021-04-07 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | On-Chip Delay Measurement for In-Field Test of FPGAs | |||||
| 言語 | en | |||||
| その他のタイトル | ||||||
| その他のタイトル | On-chip delay measurement for in-field test of FPGAs | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Miyake, Yousuke
× Miyake, Yousuke× Sato, Yasuo× 梶原, 誠司 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Avoidance of delay-related failures due to aging phenomena is an important issue of current VLSI systems. Delay measurement in field is effective for detection of aging-induced delay increase. This paper proposes a delay measurement method using BIST (Built-In Self-Test) in an FPGA. The proposed method consists of variable test timing generation using an embedded PLL, BIST-based delay measurement, and correction of the measured delay with reflecting temperature variance in field. In on-chip delay measurement of the proposed method, the fastest operating speed is checked by repeating delay test with several test timings. Because circuit delay is influenced by temperature during measurement, the measured delay is then corrected according to the temperature during testing. Based on test log including the corrected delay, delay degradation and aging detection can be grasped. In evaluation experiments of the propose method implemented on an Intel Cyclone IV FPGA device (60nm technology), variable test timing generation realized 96 ps timing step resolution (that is below 1% of the system clock), correction process for measured delay could reduce influence of temperature variation. Furthermore, its feasibility of the proposed method for aging detection is discussed in this paper. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 24th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2019), December 1-3, 2019, Kyoto, Japan | |||||
| 書誌情報 |
en : 2019 IEEE 24th Pacific Rim International Symposium on Dependable Computing (PRDC) p. 130-137, 発行日 2020-01-09 |
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| 出版社 | ||||||
| 出版者 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/PRDC47002.2019.00043 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-4961-5 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-1-7281-4962-2 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 548 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1555-094X | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 2473-3105 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | FPGA | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Field test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Periodic Test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Delay measurement | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Deterioration detection | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Temperature sensor | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10362956 | |||||
| 連携ID | ||||||
| 値 | 8662 | |||||
